000			00569nam a2200193 a 4500
005			20260717091106.0
008			260717s1975 ii 000 0 eng d
020			_a0070542732
041			_aeng
082	0	4	_a537.622
100	1		_aRunyan, W. R.
245	1	0	_aSemiconductor measurements and instrumentation / _cRunyan, W. R.
264		1	_aNew York : _bMcGraw-Hill, _cc1975.
300			_avii, 280 p. : ill.
490	0		_aTexas Instruments electronics series
500			_aIncludes bibliographical references and index.
650		4	_aSemiconductors.
942			_cBK
999			_c23204 _d23204